Support #556
Rendundant CT/TT measurements
Added by Herbert Falk about 3 years ago.
Updated almost 2 years ago.
Category:
Profile or Guideline
WG10 Proposal:
Will be address in 90-20 task forceCRC: Ask Johan about this issue
Discuss in Upcoming Meeting:
No
Short Proposal:
Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.
Description
Rendundant CT/TT measurements
- Status changed from New to In Progress
- Short Proposal changed from Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.
A new use case will be added to 90-20 document. to Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.
- Standard(s) changed from 90-20 to IEC 61850-90-20
- WG10 Proposal changed from Will be address in 90-20 task force
CRC: Ask Johan about this issue to Will be address in 90-20 task forceCRC: Ask Johan about this issue
- Discuss in Upcoming Meeting set to No
- Discuss in Upcoming Meeting changed from No to Yes
- Discuss in Upcoming Meeting changed from Yes to No
- To discuss in WG10 set to No
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