Support #556
Rendundant CT/TT measurements
Status:
In Progress
Priority:
Normal
Assignee:
-
Category:
Profile or Guideline
Start date:
Due date:
% Done:
0%
Estimated time:
ID:
3
Source:
H30
TF Unique ID:
3 # H30
WG10 Proposal:
Will be address in 90-20 task forceCRC: Ask Johan about this issue
Estimated Completion:
Discuss in Upcoming Meeting:
No
To discuss in WG10:
No
Short Proposal:
Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.
Standard(s):
IEC 61850-90-20
Needs More Information:
Assigned TF:
Description
Rendundant CT/TT measurements
Updated by Vladan Cvejic about 3 years ago
- Short Proposal changed from Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources. A new use case will be added to 90-20 document. to Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.
- Standard(s) changed from 90-20 to IEC 61850-90-20
- WG10 Proposal changed from Will be address in 90-20 task force CRC: Ask Johan about this issue to Will be address in 90-20 task forceCRC: Ask Johan about this issue
- Discuss in Upcoming Meeting set to No
Updated by Carlos Rodriguez del Castillo about 3 years ago
- Discuss in Upcoming Meeting changed from No to Yes
Updated by Vladan Cvejic almost 2 years ago
- Discuss in Upcoming Meeting changed from Yes to No
- To discuss in WG10 set to No