Project

General

Profile

Support #556

Rendundant CT/TT measurements

Added by Herbert Falk almost 2 years ago. Updated 5 months ago.

Status:
In Progress
Priority:
Normal
Assignee:
-
Category:
Profile or Guideline
Start date:
Due date:
% Done:

0%

Estimated time:
ID:
3
Source:
H30
TF Unique ID:
3 # H30
WG10 Proposal:

Will be address in 90-20 task forceCRC: Ask Johan about this issue

Estimated Completion:
Discuss in Upcoming Meeting:
No
To discuss in WG10:
No
Short Proposal:

Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.

Standard(s):

IEC 61850-90-20

Needs More Information:

Description

Rendundant CT/TT measurements

#1

Updated by Herbert Falk almost 2 years ago

  • Status changed from New to In Progress
#2

Updated by Vladan Cvejic almost 2 years ago

  • Short Proposal changed from Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources. A new use case will be added to 90-20 document. to Manage dynamic selection of sampled value sources. Possible option is to define additional semantics in InRef, ExtRef to handle main and backup sources.A new use case will be added to 90-20 document.
  • Standard(s) changed from 90-20 to IEC 61850-90-20
  • WG10 Proposal changed from Will be address in 90-20 task force CRC: Ask Johan about this issue to Will be address in 90-20 task forceCRC: Ask Johan about this issue
  • Discuss in Upcoming Meeting set to No
#3

Updated by Vladan Cvejic almost 2 years ago

Checking done.

#4

Updated by Carlos Rodriguez del Castillo almost 2 years ago

  • Discuss in Upcoming Meeting changed from No to Yes
#5

Updated by Vladan Cvejic 5 months ago

  • Discuss in Upcoming Meeting changed from Yes to No
  • To discuss in WG10 set to No

Also available in: Atom PDF